Quasi-S will be present at the 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits from 18 – 21 July 2016.
Visit us at Booth A05 @Marina Bay Sands
The 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2016) is organized by the IEEE Reliability/CPMT/ED Singapore Chapter. The Symposium is technically co-sponsored by the IEEE Electron Device Society and IEEE Reliability Society.
IPFA 2016 will be devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability and yield, especially those related to advanced process technologies.
We will showcase Hitachi TM3030Plus, an equipment with simple and quick set up like a normal PC, yet perform beyond capability in any Scanning Electron Microscope.
IPFA-Home - CLICK